Progress on Characterization with Integrated Test Structures of Dielectric and Superconducting Films for SIS Mixer Circuits

Details Progress on Characterization with Integrated Test Structures of Dielectric and Superconducting Films for SIS Mixer Circuits Progress on Characterization with Integrated Test Structures of Dielectric and Superconducting Films for SIS Mixer Circuits

Mar 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996stt..conf..356l&link_type=article

Proceedings of the Seventh International Symposium on Space Terahertz Technology, held March 12-14, 1996, at the University of V

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