Physics – Optics
Scientific paper
Dec 2003
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003apopt..42.6945u&link_type=abstract
Applied Optics, Volume 42, Issue 34, pp. 6945-6952 (2003).
Physics
Optics
2
X-Ray Optics, X-Ray Spectrometers, Astronomical Telescopes, Mirrors, Optical Multilayers, Angular Measurement, Reflectivity
Scientific paper
A method of fabricating replica figured x-ray optics with integral multilayer coatings is presented. With the intact electroforming multilayer process (IEMP) technique, we sputter multilayers onto a reusable superpolished mandrel, electroform nickel over the multilayers, and remove the multilayer-coated nickel shell intact from the mandrel. This approach offers advantages over more traditional, original, and segmented-replica fabrication techniques, including low cost; compatibility with a wide range of mirror designs, diameters, and focal lengths; simple integration with multilayer sputtering processes; and the ability to produce complete shells of revolution. The fabrication of W/Si multilayer-coated 10-cm-diameter conical x-ray mirrors is described, as are reflectivity measurements at 10 and 30 keV. The measured reflectivity of the IEMP multilayers at the 10-keV primary Bragg peak was 17%. Measurements of multiple points on the cone showed multilayer uniformity to within a few percent around the mirror.
Altkorn Robert
Chu Yong S.
Graham Michael E.
Madan Anita
Ulmer Melville P.
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