Physics
Scientific paper
Jun 1996
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2746..101o&link_type=abstract
Proc. SPIE Vol. 2746, p. 101-112, Infrared Detectors and Focal Plane Arrays IV, Eustace L. Dereniak; Robert E. Sampson; Eds.
Physics
2
Scientific paper
Producibility and factory improvements continue to advance the state-of-the-art in hybrid uncooled infrared detector manufacturing. The emphasis has shifted from proof-of- principle experiments to implementation and refinement in the areas of facilities, statistical process control, wafer level processing, and in the resolution of several key yield problems. Improvements in yield, throughput, and consistency demonstrate the maturation of Texas Instruments' detector factory from a research and development oriented lab to a production facility. Reliability and field testing are also confirming detector suitability to the market. The present discussion addresses these recent developments and their impact on the evolution toward a low cost, infrared detector.
Belcher Jeff
Beratan Howard
Frank Steve
Owen Robert A.
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