Preliminary results of 3D-DDTC pixel detectors for the ATLAS upgrade

Physics – Instrumentation and Detectors

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

8 pages, 8 figures, presented at RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Sem

Scientific paper

3D Silicon sensors fabricated at FBK-irst with the Double-side Double Type Column (DDTC) approach and columnar electrodes only partially etched through p-type substrates were tested in laboratory and in a 1.35 Tesla magnetic field with a 180GeV pion beam at CERN SPS. The substrate thickness of the sensors is about 200um, and different column depths are available, with overlaps between junction columns (etched from the front side) and ohmic columns (etched from the back side) in the range from 110um to 150um. The devices under test were bump bonded to the ATLAS Pixel readout chip (FEI3) at SELEX SI (Rome, Italy). We report leakage current and noise measurements, results of functional tests with Am241 gamma-ray sources, charge collection tests with Sr90 beta-source and an overview of preliminary results from the CERN beam test.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Preliminary results of 3D-DDTC pixel detectors for the ATLAS upgrade does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Preliminary results of 3D-DDTC pixel detectors for the ATLAS upgrade, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Preliminary results of 3D-DDTC pixel detectors for the ATLAS upgrade will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-144102

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.