Preflight characterization of the SAGE III instrument

Details Preflight characterization of the SAGE III instrument Preflight characterization of the SAGE III instrument

Oct 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999spie.3756..110v&link_type=abstract

Proc. SPIE Vol. 3756, p. 110-120, Optical Spectroscopic Techniques and Instrumentation for Atmospheric and Space Research III, A

Physics

Scientific paper

The SAGE III instrument design, and sampling modes are presented. The central focus will be on the instrument test data useful for characterization and their relevance to processing algorithms. The following effects will be discussed: spectrometer stray light and 'line spread;' CCD substrate scattering into the readout registers; dark current; charge transfer efficiency; wavelength calibration; and etaloning. Test data from Sun/Moon-Look testing from all three instruments will be presented.

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