Precision half-life measurement of the 4-fold forbidden electron capture of V-50

Details Precision half-life measurement of the 4-fold forbidden electron capture of V-50 Precision half-life measurement of the 4-fold forbidden electron capture of V-50

2011-03-30

arxiv.org/abs/1103.5872v2

Phys.Rev.C83:054322,2011

Physics

Nuclear Physics

Nuclear Experiment

4 pages, 3 figures, replaced with published version

Scientific paper

10.1103/PhysRevC.83.054322

A sensitive search of the 4-fold forbidden non-unique beta decay of V-50 has been performed. A total exposure of 185.8 kg x d has been accumulated. A reliable half-life value with the highest precision so far of $(2.29 \pm 0.25) \cdot 10^{17}$ years of the electron capture decay of V-50 into the first excited state of Ti-50 could be obtained. A photon emission line following the 4-fold forbidden beta decay into the first excited state of Cr-50 could not be observed, resulting in a lower limit on the half-life of the beta decay branch of $1.7 \cdot 10^{18}$ years. This is barely in agreement with a claimed observation of this decay branch.

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