Post-stishovite phase boundary in SiO2 determined by in situ X-ray observations

Details Post-stishovite phase boundary in SiO2 determined by in situ X-ray observations Post-stishovite phase boundary in SiO2 determined by in situ X-ray observations

Apr 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002e%26psl.197..187o&link_type=abstract

Earth and Planetary Science Letters, Volume 197, Issue 3-4, p. 187-192.

Physics

28

Scientific paper

A laser heating diamond anvil cell experiment, with an angle-dispersive X-ray diffraction using synchrotron radiation source at the SPring-8, has been developed to observe the phase transition in silica (SiO2) between the P42/mnm (rutile-type) and Pnnm (CaCl2-type) up to pressures of 100 GPa and at temperatures up to 2200 K. The transition was observed in the vicinity of 55 GPa at room temperature, and showed a positive temperature dependence of the transition pressure. The phase boundary was determined to follow the equation P (GPa)=(51+/-2)+(0.012+/-0.005)×T (K). Our result gives a transition pressure of near 80 GPa and a depth of 1900 km at an expected lower mantle temperature of 2000-2500 K. Therefore, this SiO2 transition is not the cause of recent observations of seismic anomalies between 800 and 1600 km depth in the mid-lower mantle.

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