Post-Spinel Transition in Mg2SiO4 Determined by High P-T In Situ X-Ray Diffractometry

Details Post-Spinel Transition in Mg2SiO4 Determined by High P-T In Situ X-Ray Diffractometry Post-Spinel Transition in Mg2SiO4 Determined by High P-T In Situ X-Ray Diffractometry

May 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001eag..conf.3536k&link_type=article

Eleventh Annual V. M. Goldschmidt Conference, May 20-24, 2001, Hot Springs, Virginia, abstract no.3536

Physics

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