Polytype Distribution in Presolar SiC: Microstructural Characterization by Transmission Electron Microscopy

Details Polytype Distribution in Presolar SiC: Microstructural Characterization by Transmission Electron Microscopy Polytype Distribution in Presolar SiC: Microstructural Characterization by Transmission Electron Microscopy

Mar 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002lpi....33.1127d&link_type=abstract

33rd Annual Lunar and Planetary Science Conference, March 11-15, 2002, Houston, Texas, abstract no.1127

Physics

2

Scientific paper

In the laboratory, SiC is known to form as hundreds of different
polytypes and the formation of a particular polytype is sensitive to
growth conditions. TEM is used to determine the polytype distribution of
presolar SiC, isolated from Murchison.

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