Polarized monochromatic x-ray beam extracted from laboratory electron impact source

Details Polarized monochromatic x-ray beam extracted from laboratory electron impact source Polarized monochromatic x-ray beam extracted from laboratory electron impact source

Jul 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4012..414k&link_type=abstract

Proc. SPIE Vol. 4012, p. 414-421, X-Ray Optics, Instruments, and Missions III, Joachim E. Truemper; Bernd Aschenbach; Eds.

Physics

Optics

Scientific paper

We measure the polarization degree of monochromatic X-rays from an electron impact type X-ray generator through a double crystal spectrometer. The double crystal spectrometer is installed so that it enhances the polarization from the generator by its different efficiency for (pi) and (sigma) polarized X-rays. Measurement is performed for applied high voltage (HV) of 20 kV to 50 kV, and monochromatic X-ray energy in the unit of keV (Ex) of 0.7 to 0.9 times HV. We obtain the polarization degree of 0.48 and 0.41 for HV equals 20 and HV equals 50 with Ex/HV equals 0.9. We also measure the polarization degree of direct beam without the monochrometer, comparing the polarization boosting factor by crystals measured with theoretical model. The system is good for getting moderate intensity of partially polarized monochromatic X-ray beam.

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