Performance studies of CdZnTe detector by using a pulse shape analysis

Details Performance studies of CdZnTe detector by using a pulse shape analysis Performance studies of CdZnTe detector by using a pulse shape analysis

Aug 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5922...89b&link_type=abstract

Hard X-Ray and Gamma-Ray Detector Physics VII. Edited by James, Ralph B.; Franks, Larry A.; Burger, Arnold. Proceedings of the

Physics

Scientific paper

Pulse shape analysis is proved to be a powerful tool to characterize the performance of CdZnTe devices and understand their operating principles. It allows one to investigate the device configurations, electron transport properties, effects governing charge collection, electric-field distributions, signal charge formation, etc. This work describes an application of different techniques based on the pulse shape measurements to characterize pixel, coplanar-grid, and virtual Frisch-grid devices and understand the electronic properties of CZT material provided by different vendors. We report new results that may explain the performance limits of these devices.

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