Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet

Details Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet

Nov 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993spie.2006..252m&link_type=abstract

Proc. SPIE Vol. 2006, p. 252-257, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, Oswald H. Siegmund; Ed.

Astronomy and Astrophysics

Astronomy

1

Scientific paper

The quantum efficiency (QE) and flat field characteristics of back-illuminated 1024 X 1024 Tektronix CCDs have been measured in the extreme ultraviolet (EUV) between 44 and 1216 angstroms. These CCDs have been fabricated for the focal plane detector of the Extreme-ultraviolet Imaging Telescope (EIT) on the Solar and Heliospheric Observing spacecraft. The back-side surface of the EIT CCDs have been specially processed to enhance and stabilize the EUV QE. All requirements for QE are met by these devices, although a poorly understood variation of QE with temperature will complicate data analysis.

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