Overview of SIM external calibration

Details Overview of SIM external calibration Overview of SIM external calibration

Feb 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.4852..623s&link_type=abstract

Interferometry in Space. Edited by Shao, Michael. Proceedings of the SPIE, Volume 4852, pp. 623-633 (2003).

Physics

Optics

1

Scientific paper

Like all astrometric instruments, the Space Interferometry Mission (SIM) suffers from field-dependent errors requiring calibration. Diffraction effects in the delay line, polarization rotations on corner cubes, and beam walk across imperfect optics, all contribute to field-distortion that is significantly larger than is acceptable. The bulk of the systematic error is linear across the field - that is, it results in magnification and rotation errors. We show that the linear terms are inconsequential to the performance of SIM because they are inseparable from baseline length and orientation errors. One approach to calibrating the higher-order terms is to perform 'external' calibration; that is, SIM periodically makes differential measurements of a field of bright stars whose positions are not precisely known. We describe the requirements and constraints on the external calibration process and lay the groundwork for a specific procedure detailed in accompanying papers.

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