Optically trapped probes with nanometer-scale tips for femto-Newton force measurement

Details Optically trapped probes with nanometer-scale tips for femto-Newton force measurement Optically trapped probes with nanometer-scale tips for femto-Newton force measurement

Nov 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010njph...12k3056p&link_type=abstract

New Journal of Physics, Volume 12, Issue 11, pp. 113056 (2010).

Physics

Scientific paper

We describe the development of a novel force probe, controlled by multiple optical traps, with a nanometer-scale tip that protrudes outside the direct laser radiation field. We have measured forces to an accuracy of 240 fN, which enables future experiments that probe photo-sensitive components (such as biological cells) and non-transparent objects. The probes were produced using two methods, electron beam lithography and two-photon polymerization, with the latter providing approximately twice as much trapping stiffness.

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