Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV

Details Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV

Feb 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004spie.5168...35w&link_type=abstract

Optics for EUV, X-Ray, and Gamma-Ray Astronomy. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5

Physics

Optics

2

Scientific paper

We have determined experimentally optical constants for eight thin film materials that can be used in hard X-ray multilayer coatings. Thin film samples of Ni.97V.03, Mo, W, Pt, C, B4C, Si and SiC were deposited by magnetron sputtering onto superpolished optical flats. Optical constants were determined from fits to reflectance-vs-incidence angle measurements made using synchrotron radiation over the energy range E=35 180 keV. We have also measured the X-ray reflectance of a prototype W/SiC multilayer coating over the energy range E=35 100 keV, and we compare the measured reflectance with a calculation using the newly derived optical constants.

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