On the characterization of a random monolayer of particles from coherent optical reflectance

Details On the characterization of a random monolayer of particles from coherent optical reflectance On the characterization of a random monolayer of particles from coherent optical reflectance

2010-01-19

arxiv.org/abs/1001.3350v1

Proc. SPIE, Vol. 7386, 738612 (2009)

Physics

Optics

Conference Date: Sunday 24 May 2009 Conference Location: Quebec, Canada Conference Title: Photonics North 2009 Conference Chai

Scientific paper

10.1117/12.839606

We present the viability of obtaining the particle size and surface coverage in a monolayer of polystyrene particles adsorbed on a glass surface from optical coherent reflectance data around the critical angle in an internal reflection configuration. We have found that fitting a CSM to optical reflectivity curves in an internal reflection configuration around the critical angle with a dilute random monolayer of particles adsorbed on the surface can in fact provide the particle's radius and surface coverage once the particles are sufficiently large.

Affiliated with

Also associated with

No associations

Rating

On the characterization of a random monolayer of particles from coherent optical reflectance does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with On the characterization of a random monolayer of particles from coherent optical reflectance, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On the characterization of a random monolayer of particles from coherent optical reflectance will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-636820