Normal incidence imaging multilayer x-ray mirrors with the periods of nanometer and subnanometer scale

Details Normal incidence imaging multilayer x-ray mirrors with the periods of nanometer and subnanometer scale Normal incidence imaging multilayer x-ray mirrors with the periods of nanometer and subnanometer scale

Feb 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2011..402s&link_type=abstract

Proc. SPIE Vol. 2011, p. 402-412, Multilayer and Grazing Incidence X-Ray/EUV Optics II, Richard B. Hoover; Arthur B. Walker; Eds

Physics

Optics

1

Scientific paper

Deposition possibility of small d-spacing (d equals 0.7 - 3 nm) multilayers on the basis of the material combinations W/Sb, W/Sc, Cr/Sc, Fe/Sc and their utilization as dispersive and focusing elements for the photon energy range E > 0.3 kev have been investigated. The use of the normal incidence spherical multilayers W/Sb, W/Sc and Cr/Sc for imaging of a high temperature laser produced plasma within the `water window' spectral range (0.3 < E < 0.5 kev) is presented.

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