Noninvasive measurement of micron electron beam size of high energy using diffraction radiation

Details Noninvasive measurement of micron electron beam size of high energy using diffraction radiation Noninvasive measurement of micron electron beam size of high energy using diffraction radiation

2003-05-05

arxiv.org/abs/hep-ex/0305004v3

Physics

High Energy Physics

High Energy Physics - Experiment

6 pages, 6 figures

Scientific paper

Treatments of the usage of optical diffraction radiation from the relativistic electrons moving though a conductive slit for the noninvasive transverse beam size measurement encounter hard limitation of the method sensitivity for the electron energy larger than 1 GeV. We consider in this article a possibility of application in a diffraction radiation technique the artificial phase shift, which can take place when transverse electron position varies. This allows us to realize the nonivasive measurements of transverse size of supper-relativistic electron beams with the small emittance.

Affiliated with

Also associated with

No associations

Rating

Noninvasive measurement of micron electron beam size of high energy using diffraction radiation does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Noninvasive measurement of micron electron beam size of high energy using diffraction radiation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Noninvasive measurement of micron electron beam size of high energy using diffraction radiation will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-41309