Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection

Details Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection

2011-11-17

arxiv.org/abs/1111.4120v1

Opt. Lett. 37, 1070-1072 (2012)

Physics

Optics

4 pages, 3 figures

Scientific paper

We experimentally demonstrate a non-imaging approach to displacement measurement for complex scattering materials. By spatially controlling the wave front of the light that incidents on the material we concentrate the scattered light in a focus on a designated position. This wave front acts as an unique optical fingerprint that enables precise position detection of the illuminated material by simply measuring the intensity in the focus. By combining two optical fingerprints we demonstrate position detection along one dimension with a displacement resolution of 2.1 nm. As our approach does not require an image of the scattered field, it is possible to employ fast non-imaging detectors to enable high-speed position detection of scattering materials.

Affiliated with

Also associated with

No associations

Rating

Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-350042