Non-Contact Electron Optics System for Coincidence Imaging Analysis

Details Non-Contact Electron Optics System for Coincidence Imaging Analysis Non-Contact Electron Optics System for Coincidence Imaging Analysis

Apr 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010apsp.conf..631k&link_type=abstract

ASTROPARTICLE, PARTICLE AND SPACE PHYSICS, DETECTORS AND MEDICAL PHYSICS APPLICATIONS. Proceedings of the 11th Conference. Held

Physics

Medical Physics

Scientific paper

An electron imaging system has been developed for spatial information in coincidence Instrumental Neutron Activation Analysis. In our technique, a beta-radioactive sample is scanned at once where the electrons are detected in the position-sensitive Timepix detector in coincidence with γ-rays. Following our previous work where the detector was used in close-contact sample geometry, we have built a devoted non-contact electron optic system to focus coincidence electrons for imaging measurements with enhanced spatial resolution and reduced blurring. This contribution describes the electron focusing system and its evaluation.

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