Non-contact atomic force microscopy: Stability criterion and dynamical responses of the shift of frequency and damping signal

Details Non-contact atomic force microscopy: Stability criterion and dynamical responses of the shift of frequency and damping signal Non-contact atomic force microscopy: Stability criterion and dynamical responses of the shift of frequency and damping signal

2005-10-21

arxiv.org/abs/physics/0510192v1

Review of Scientific Instruments 74 (2003) 2726-2734

Physics

Atomic and Molecular Clusters

Scientific paper

10.1063/1.1564274

The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability conditions are first revisited for tapping mode. Adding the equations of automatic gain control (AGC), which insures constant amplitude of the oscillations in the NC-AFM, to the equations of motion of the tip, a new analytical stability criterion that involves proportional and integral gains of AGC is deduced. Stationary solutions for the shift of frequency and for the damping signal are obtained. Special attention is paid to the damping signal in order to clarify its physical origin. The theoretical results are then compared to those given by a virtual machine. The virtual machine is a set of equations solved numerically without any approximation. The virtual machine is of great help in understanding the dynamical behavior of the NC-AFM as images are recorded. Transient responses of the shift in frequency and of the damping signal are discussed in relation to the values of proportional and integral gains of AGC.

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