Noise analysis and performance of a selfscanned linear InSb detector array

Computer Science – Performance

Scientific paper

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Electromagnetic Noise, Indium Antimonides, Infrared Detectors, Semiconductor Devices, Electric Potential, Linear Arrays, Noise Reduction, Shift Registers

Scientific paper

A noise model for detectors operated in the capacitive discharge mode is presented. It is used to analyze the noise performance of the ESO nested timing readout technique applied to a linear 32-element InSb array which is multiplexed by a silicon switched-FET shift register. Analysis shows that KTC noise of the video line is the major noise contribution; it can be eliminated by weighted double-correlated sampling. Best noise performance of this array is achieved at the smallest possible reverse bias voltage (not more than 20 mV) whereas excess noise is observed at higher reverse bias voltages.

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