NIRCam optical analysis

Details NIRCam optical analysis NIRCam optical analysis

Aug 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5904...38m&link_type=abstract

Cryogenic Optical Systems and Instruments XI. Edited by Heaney, James B.; Burriesci, Lawrence G. Proceedings of the SPIE, Volume

Physics

Optics

Scientific paper

The Near Infrared Camera (NIRCam) instrument for NASA's James Webb Space Telescope (JWST) is one of the four science instruments to be installed into the Integrated Science Instrument Module (ISIM) on JWST. NIRCam's requirements include operation at 37 Kelvin to produce high-resolution images in two wave bands encompassing the range from 0.6 microns to 5 microns. In addition, NIRCam is to be used as a metrology instrument during the JWST observatory commissioning on orbit, during the precise alignment of the observatory's multiple-segment primary mirror. This paper will present the optical analyses performed in the development of the NIRCam optical system. The Compound Reflectance concept to specify coating on optics for ghost image reduction is introduced in this paper.

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