New Schemes for Self-Testing RAM

Details New Schemes for Self-Testing RAM New Schemes for Self-Testing RAM

2007-10-25

arxiv.org/abs/0710.4657v1

Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)

Computer Science

Hardware Architecture

Submitted on behalf of EDAA (http://www.edaa.com/)

Scientific paper

This paper gives an overview of a new technique, named pseudo-ring testing
(PRT). PRT can be applied for testing wide type of random access memories
(RAM): bit- or word-oriented and single- or dual-port RAM's. An essential
particularity of the proposed methodology is the emulation of a linear
automaton over Galois field by memory own components.

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