Near-field optical imaging with a non-evanescently excited high-brightness light source of sub-wavelength dimensions

Details Near-field optical imaging with a non-evanescently excited high-brightness light source of sub-wavelength dimensions Near-field optical imaging with a non-evanescently excited high-brightness light source of sub-wavelength dimensions

Nov 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991natur.354..214l&link_type=abstract

Nature (ISSN 0028-0836), vol. 354, Nov. 21, 1991, p. 214-216. Research supported by USAF, USIBSF, and National Council for Resea

Physics

40

Evanescence, Imaging Techniques, Laser Induced Fluorescence, Light Sources, Near Fields, Carbon Dioxide Lasers, Metal Coatings, Optical Properties, Surface Roughness

Scientific paper

A technique is presented that creates a point of subwavelength light without associated evancescent losses in its excitation while achieving the advantage of the exponential increase in intensity that occurs within the near field. The subwavelength light source is provided by a micropipette coated with a metal and filled with a fluorescent dye embedded in a plastic matrix. The instrument combines the potential for near-field microscopy with the characteristics of a conventional far-field light microscope. Images with overlapping resolutions can be obtained having magnifications that range from a few hundred with the conventional microscope to magnifications in the near-field model of tens of thousands that are of the order normally associated with SEM. Such imaging with light can be achieved even with fluorescence under ambient conditions and without the destructive sample preparation and beam damage characteristic of electron microscopy.

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