Nanoparticle characterization by using Tilted Laser Microscopy: back scattering measurement in near field

Details Nanoparticle characterization by using Tilted Laser Microscopy: back scattering measurement in near field Nanoparticle characterization by using Tilted Laser Microscopy: back scattering measurement in near field

2009-02-24

arxiv.org/abs/0902.4163v4

Optics Express, Vol. 17 Issue 18, pp.15431-15448 (2009)

Physics

Optics

18 pages, 10 figures. Accepted for publication in Optics Express, vol. 17, no. 17 (08/17/2009)

Scientific paper

By using scattering in near field techniques, a microscope can be easily turned into a device measuring static and dynamic light scattering, very useful for the characterization of nanoparticle dispersions. Up to now, microscopy based techniques have been limited to forward scattering, up to a maximum of 30 degrees. In this paper we present a novel optical scheme that overcomes this limitation, extending the detection range to angles larger than 90 degrees (back-scattering). Our optical scheme is based on a microscope, a wide numerical aperture objective, and a laser illumination, with the collimated beam positioned at a large angle with respect to the optical axis of the objective (Tilted Laser Microscopy, TLM). We present here an extension of the theory for near field scattering, which usually applies only to paraxial scattering, to our strongly out-of-axis s ituation. We tested our instrument and our calculations with calibrated spherical nanoparticles of several different diameters, performing static and dynamic scattering measurements up to 110 degrees. The measured static spectra and decay times are compatible with the Mie theory and the diffusion coefficients provided by the Stokes-Einstein equation. The ability of performing backscattering measurements with this modified microscope opens the way to new applications of scattering in near field techniques to the measurement of systems with strongly angle dependent scattering.

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