N and K measurement of MCT and PST by polarized reflectometry

Details N and K measurement of MCT and PST by polarized reflectometry N and K measurement of MCT and PST by polarized reflectometry

Oct 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2274..188w&link_type=abstract

Proc. SPIE Vol. 2274, p. 188-191, Infrared Detectors: State of the Art II, Randolph E. Longshore; Ed.

Physics

Scientific paper

In this paper, the measurement results of n and k of MCT and PST by
polarized reflectometry are reported. The results show that in the
infrared spectrum region the polarized reflectometry is also an
effective method for measurements of n and k.

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