Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer

Details Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer

Oct 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008jgre..11300a22h&link_type=abstract

Journal of Geophysical Research, Volume 113, Issue 5, CiteID E00A22

Physics

11

Planetary Sciences: Solid Surface Planets: Instruments And Techniques, Planetary Sciences: Solid Surface Planets: Surface Materials And Properties, Planetary Sciences: Solid Surface Planets: Polar Regions

Scientific paper

The Phoenix microscopy station, designed for the study of Martian dust and soil, consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimeter to nanometer scale. Light-emitting diode illumination allows for full color optical imaging of the samples as well as imaging of ultraviolet-induced visible fluorescence. The atomic force microscope uses an array of silicon tips and can operate in both static and dynamic mode.

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