Microfield distributions in strongly coupled two-component plasmas

Details Microfield distributions in strongly coupled two-component plasmas Microfield distributions in strongly coupled two-component plasmas

2005-04-21

arxiv.org/abs/physics/0504152v1

Physics

Plasma Physics

18 figures. Submitted to Phys. Rev. E

Scientific paper

10.1103/PhysRevE.72.036403

The electric microfield distribution at charged particles is studied for two-component electron-ion plasmas using molecular dynamics simulation and theoretical models. The particles are treated within classical statistical mechanics using an electron-ion Coulomb potential regularized at distances less than the de Broglie length to take into account the quantum-diffraction effects. The potential-of-mean-force (PMF) approximation is deduced from a canonical ensemble formulation. The resulting probability density of the electric microfield satisfies exactly the second-moment sum rule without the use of adjustable parameters. The correlation functions between the charged radiator and the plasma ions and electrons are calculated using molecular dynamics simulations and the hypernetted-chain approximation for a two-component plasma. It is shown that the agreement between the theoretical models for the microfield distributions and the simulations is quite good in general.

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