Metrology of IXO mirror segments

Details Metrology of IXO mirror segments Metrology of IXO mirror segments

Sep 2011

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2011spie.8147e..39c&link_type=abstract

Optics for EUV, X-Ray, and Gamma-Ray Astronomy V. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, V

Physics

Optics

Scientific paper

For future x-ray astrophysics mission that demands optics with large throughput and excellent angular resolution, many telescope concepts build around assembling thin mirror segments in a Wolter I geometry, such as that originally proposed for the International X-ray Observatory. The arc-second resolution requirement posts unique challenges not just for fabrication, mounting but also for metrology of these mirror segments. In this paper, we shall discuss the metrology of these segments using normal incidence metrological method with interferometers and null lenses. We present results of the calibration of the metrology systems we are currently using, discuss their accuracy and address the precision in measuring near-cylindrical mirror segments and the stability of the measurements.

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