Mechanical Q-factor measurements on a test mass with a structured surface

Details Mechanical Q-factor measurements on a test mass with a structured surface Mechanical Q-factor measurements on a test mass with a structured surface

Jul 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007njph....9..225n&link_type=abstract

New Journal of Physics, Volume 9, Issue 7, pp. 225 (2007).

Physics

5

Scientific paper

We present mechanical Q-factors (quality factors) of a crystalline quartz test mass with a nano-structured surface, measured in the temperature regime from 5 to 300 K. The nano-structure was a grating with a period of 2 μm and a depth of about 0.1 μm. Comparative measurements were performed on the plain substrate and on the structured test mass with different numbers of SiO2/Ta2O5 coating layers. The measurements at different stages of the test mass fabrication process show that the surface distortion induced by the nanostructure does not severely lower the mechanical Q-factor of the substrate. Damping due to a multi-layer coating stack was found to be orders of magnitude higher. The results provide vital information concerning the potential usage of low-thermal noise nano-structured test masses in future generations of high-precision laser interferometers and in current attempts to measure quantum effects of macroscopic mirror oscillators.

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