Physics
Scientific paper
Jul 1997
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997jqsrt..58..135w&link_type=abstract
Journal of Quantitative Spectroscopy and Radiative Transfer, vol. 58, issue 1, pp. 135-140
Physics
3
Stark Broadening: Silicon Lines, Stark Broadening: Line Profiles
Scientific paper
Line profiles of the λ = 3862, 3856 and 3854 Å lines have been measured in a conventional shock tube. For the weak λ = 3854 Å line, a new deconvolution method provides the first measurement of its Stark width. Electron densities vary in the range 0.5-2.0×1023m-3, and temperatures from 11,000 to 14,500 K. The Stark effect is the dominant broadening mechanism. Two different methods of line-profile recording and deconvolution are used to obtain the Stark parameters. The broadening constant for all lines of the multiplet has the same value, i.e., 0.56 Å/1023m-3 ±10%. No significant temperature dependence could be detected. For all lines a small blue shift was measured. Present measurements discriminate between earlier experimental and theoretical results, which disagreed by a factor of two.
Depiesse M.
Lesage Alain
Meiners D.
Mitsching J.
Richou Jacques
No associations
LandOfFree
Measurements of the ionised silicon multiplet (1) Stark parameters by two different methods. does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Measurements of the ionised silicon multiplet (1) Stark parameters by two different methods., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurements of the ionised silicon multiplet (1) Stark parameters by two different methods. will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-1414756