Measurements of RF Cavity Voltages by X-ray Spectrum Measurements

Details Measurements of RF Cavity Voltages by X-ray Spectrum Measurements Measurements of RF Cavity Voltages by X-ray Spectrum Measurements

2000-08-09

arxiv.org/abs/physics/0008024v3

eConf C000821 (2000) MOc08

Physics

Accelerator Physics

For LINAC 2000 Conference, Monterey, 21-25 August 2000 Paper no. MOC08 Second PostScript version to replace first PostScript v

Scientific paper

Measurement of the endpoints of X-ray spectra emitted from RF cavities is a
useful non-invasive technique for measuring peak voltages within the cavities.
The matching of calculated X-ray spectra to measured spectra is described, with
emphasis upon the endpoint region.

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