Measurements of Lowest-S-State Lifetimes of Gallium, Indium, and Thalium

Details Measurements of Lowest-S-State Lifetimes of Gallium, Indium, and Thalium Measurements of Lowest-S-State Lifetimes of Gallium, Indium, and Thalium

Mar 1971

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1971phrva...3..915n&link_type=abstract

Physical Review A, vol. 3, Issue 3, pp. 915-927

Physics

19

Scientific paper

The lifetimes of the gallium 52S12 state, the indium 62S12 state, and the thallium 72S12 state were measured using the zero-field level-crossing (Hanle-effect) technique. The life-times obtained were (6.8+/-0.3) × 10-9, (7.0+/-0.3) × 10-9, and (7.45+/-0.2) × 10-9 sec, respectively. Anomalous contributions to the level-crossing signals, from the wavelength dependence of the exciting light intensity and self-absorption by the fluorescing atomic beam, were investigated in detail.

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