Measurement of waveplate retardation using a photoelastic modulator

Details Measurement of waveplate retardation using a photoelastic modulator Measurement of waveplate retardation using a photoelastic modulator

Oct 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3121...19o&link_type=abstract

Proc. SPIE Vol. 3121, p. 19-22, Polarization: Measurement, Analysis, and Remote Sensing, Dennis H. Goldstein; Russell A. Chipman

Physics

4

Scientific paper

A system for measurement of waveplate retardation using a photoelastic
modulator will be described. The system is intended for incoming quality
inspection of quarter-wave plates at 632.8 nm and 900 nm. Measurement of
several polymer waveplates were in good agreement with the waveplate
manufacturer's calibration data.

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