Measurement of the third-order optical nonlinear properties of a metal/porous silicon composite system

Details Measurement of the third-order optical nonlinear properties of a metal/porous silicon composite system Measurement of the third-order optical nonlinear properties of a metal/porous silicon composite system

Mar 2011

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2011opten..50c3604x&link_type=abstract

Optical Engineering, Volume 50, Issue 3, pp. 033604-033604-5 (2011).

Physics

Optics

Metallic Thin Films, Nonlinear Optics, Optical Properties, Porous Materials, Refractive Index, Silicon, Sputtering, Nonlinear Optics, Metals And Metallic Alloys, Flows Through Porous Media

Scientific paper

We report the measurements of the nonlinear refractive index of a metal/porous silicon composite system as measured by the reflection Z-scan technique. The composite system is formed by using magnetron sputtering to deposit thin metallic films onto porous silicon anodized on p-type silicon. The experiment results indicate an enhancement over the nonlinear refractive index of the composite system, which suggests an opportunity to form new-type nonlinear-optical media consisting of porous silicon for nonlinear optical applications such as power limiting or optical switching.

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