Measurement of the lattice parameter of a silicon crystal

Details Measurement of the lattice parameter of a silicon crystal Measurement of the lattice parameter of a silicon crystal

May 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009njph...11e3013m&link_type=abstract

New Journal of Physics, Volume 11, Issue 5, pp. 053013 (2009).

Physics

4

Scientific paper

The silicon crystal WASO04 is a reference in the adjustment of fundamental physical constants, but its lattice parameter has never been measured in absolute terms. In the framework of an international project meant to base the kilogram definition on the molar volume and the lattice parameter of 28Si, the WASO04 crystal has been used to manufacture an interferometer prototype for the performance testing and the fine-tuning of a new experimental apparatus for lattice parameter measurements by combined x-ray and optical interferometry. The present paper discusses the test results and gives an accurate lattice parameter determination. With respect to previous determinations, the value obtained, d220(WASO04)=192.015 570 2(10) pm, displays a four-fold improvement in accurracy.

Affiliated with

Also associated with

No associations

Rating

Measurement of the lattice parameter of a silicon crystal does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Measurement of the lattice parameter of a silicon crystal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Measurement of the lattice parameter of a silicon crystal will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1110092