Measurement of low-level strain retardation in optical materials

Details Measurement of low-level strain retardation in optical materials Measurement of low-level strain retardation in optical materials

Oct 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3121...23o&link_type=abstract

Proc. SPIE Vol. 3121, p. 23-27, Polarization: Measurement, Analysis, and Remote Sensing, Dennis H. Goldstein; Russell A. Chipman

Physics

1

Scientific paper

A method for measurement of low-level strain birefringence in optical elements and materials will be described. This method provides for the simultaneous measurement of magnitude and direction of the net retardation without the necessity of sample rotation. Good agreement was obtained between measured retardation and independent measurements of a polymer waveplate. Measurements were also made of uncalibrated samples with retardation magnitudes down to 1.5 nanometers.

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