Measurement of atomic diffraction phases induced by material gratings

Details Measurement of atomic diffraction phases induced by material gratings Measurement of atomic diffraction phases induced by material gratings

2005-08-26

arxiv.org/abs/physics/0508196v1

Physics

Atomic Physics

4 pages, 5 figures, submitted to PRL

Scientific paper

10.1103/PhysRevA.73.033610

Atom-surface interactions can significantly modify the intensity and phase of atom de Broglie waves diffracted by a silicon nitride grating. This affects the operation of a material grating as a coherent beam splitter. The phase shift induced by diffraction is measured by comparing the relative phases of serveral interfering paths in a Mach-Zehnder Na atom interferometer formed by three material gratings. The values of the diffraction phases are consistent with a simple model which includes a van der Waals atom-surface interaction between the Na atoms and the silicon nitride grating bars.

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