Maximizing the electric field strength in the foci of high numerical aperture optics

Details Maximizing the electric field strength in the foci of high numerical aperture optics Maximizing the electric field strength in the foci of high numerical aperture optics

2008-11-13

arxiv.org/abs/0811.2098v3

Physics

Optics

9 pages, 8 figures, rewritten Sec. II (contains now a revised derivation of the central formula which was in Sec. V in former

Scientific paper

Several applications require spatial distributions of the incident electric field that maximize the electric field at a focal point for a given input power. The field distributions are derived for various optical systems in a direct way based on fundamental physical properties. The results may prove useful for a wide range of applications, e.g., microscopy, scattering experiments or excitation of single atoms. For commonly used distributions - fundamental Gaussian modes and doughnut modes - we give the upper bounds of the achievable field amplitudes.

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