Low temperature dewar for 1-MeV electron transient testing of infrared focal plane arrays

Details Low temperature dewar for 1-MeV electron transient testing of infrared focal plane arrays Low temperature dewar for 1-MeV electron transient testing of infrared focal plane arrays

Sep 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989spie.1108..192r&link_type=toc

Proc. SPIE Vol. 1108, p. 192-0, Test and Evaluation of Infrared Detectors and Arrays, Forney M. Hoke; Ed.

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