Low-level gamma dosimetry using low-leakage diodes

Details Low-level gamma dosimetry using low-leakage diodes Low-level gamma dosimetry using low-leakage diodes

May 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995spie.2474..306f&link_type=abstract

Proc. SPIE Vol. 2474, p. 306-311, Smart Focal Plane Arrays and Focal Plane Array Testing, Marc Wigdor; Mark A. Massie; Eds.

Physics

Scientific paper

Low-leakage silicon p-i-n diodes have been investigated for gamma rate dosimetry. Radiation- induced current response was measured versus gamma flux rate in the range of 10(superscript 7) to 10(superscript 9) gamma-photons/cm(superscript 2)(DOT)s. Energy deposition dose rates inferred from radiation-induced current agree well with expected results based on gamma energy-absorption coefficients. Degradation of diode leakage current due to total dose was also tested.

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