Low intensity threshold values for keV X-ray production in laser-cluster interaction

Details Low intensity threshold values for keV X-ray production in laser-cluster interaction Low intensity threshold values for keV X-ray production in laser-cluster interaction

2005-07-06

arxiv.org/abs/physics/0507042v1

Physics

Atomic and Molecular Clusters

1 table, 4 figures. submitted to Physical Review Letters

Scientific paper

Absolute Ar XK (3 keV) and Xe XL (4 keV) photon yields are measured as a function of laser peak intensity, for large (104 - 105 atoms) argon and xenon clusters submitted to intense laser pulses. A clear threshold behavior is observed. The intensity threshold is found as low as 2 1014 Wcm-2, a value matching the production of singly-charged argon or doubly-charged xenon by optical field ionization. Possible mechanisms involved in the inner-shell ionization are discussed. The outcome on the optimization of keV X-ray production is underlined.

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