Losses in superconducting Niobium Films caused by Interface Tunnel Exchange

Details Losses in superconducting Niobium Films caused by Interface Tunnel Exchange Losses in superconducting Niobium Films caused by Interface Tunnel Exchange

2012-04-10

arxiv.org/abs/1204.2166v1

Physics

Accelerator Physics

3 pages, 2 figures

Scientific paper

Identifying the loss mechanisms of niobium film cavities enables an accurate determination of applications for future accelerator projects and points to research topics required to mitigate their limitations. Measurements on samples show that the electric field is a dominant loss mechanism for niobium films, acting through interface tunneling between localized states in surface oxides and delocalized states in the superconducting niobium.

Affiliated with

Also associated with

No associations

Rating

Losses in superconducting Niobium Films caused by Interface Tunnel Exchange does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Losses in superconducting Niobium Films caused by Interface Tunnel Exchange, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Losses in superconducting Niobium Films caused by Interface Tunnel Exchange will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-645407