Linearization of the characteristic curve near photographic fog opens new horizons in photographic photometry

Details Linearization of the characteristic curve near photographic fog opens new horizons in photographic photometry Linearization of the characteristic curve near photographic fog opens new horizons in photographic photometry

Sep 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3140..165m&link_type=abstract

Proc. SPIE Vol. 3140, p. 165-171, Photometric Engineering of Sources and Systems, Angelo V. Arecchi; Ed.

Physics

Scientific paper

It has been shown that with correctly defined fog level of the exposed and developed photographic emulsion the characteristic curve of photographic emulsion from the linear region to the low exposure one may be linearized by using the Seidel function. For characteristic curve fitting one should know three approximation constants which may be calculated by three reference points on the image represented by three densities at three different exposures. Different exposures may be realized by different intensities of illuminating light at the same exposure time as well as by taking three images of the same object at different exposure times.

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