Lifetime statistics in chaotic dielectric microresonators

Details Lifetime statistics in chaotic dielectric microresonators Lifetime statistics in chaotic dielectric microresonators

2008-12-15

arxiv.org/abs/0812.2823v1

Phys. Rev. A 79, 053806 (2009)

Physics

Optics

7 pages, 5 figures

Scientific paper

10.1103/PhysRevA.79.053806

We discuss the statistical properties of lifetimes of electromagnetic eigenmodes in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of anomalously short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance trapping phenomenon.

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