Laser ablation loading of a surface-electrode ion trap

Details Laser ablation loading of a surface-electrode ion trap Laser ablation loading of a surface-electrode ion trap

2007-06-22

arxiv.org/abs/0706.3374v1

Physics

Quantum Physics

4 pages, 4 figures

Scientific paper

10.1103/PhysRevA.76.055403

We demonstrate loading by laser ablation of $^{88}$Sr$^+$ ions into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 3-5 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful ($\gtrsim$ 500 meV).

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