Ionization and charge migration through strong internal fields in clusters exposed to intense X-ray pulses

Details Ionization and charge migration through strong internal fields in clusters exposed to intense X-ray pulses Ionization and charge migration through strong internal fields in clusters exposed to intense X-ray pulses

2009-02-23

arxiv.org/abs/0902.3940v1

Phys. Rev. A 79, 041201 (2009)

Physics

Atomic and Molecular Clusters

5 pages, 4 figures

Scientific paper

10.1103/PhysRevA.79.041201

A general scenario for electronic charge migration in finite samples illuminated by an intense laser pulse is given. Microscopic calculations for neon clusters under strong short pulses as produced by X-ray free-electron laser sources confirm this scenario and point to the prominent role of field ionization by strong internal fields. The latter leads to the fast formation of a core-shell system with an almost static core of screened ions while the outer shell explodes. Substituting the shell ions with a different material such as helium as a sacrificial layer leads to a substantial improvement of the diffraction image for the embedded cluster thus reducing the consequences of radiation damage for coherent diffractive imaging.

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