Ionic E.U.V. branching-ratio measurements using electron-impact excitation

Details Ionic E.U.V. branching-ratio measurements using electron-impact excitation Ionic E.U.V. branching-ratio measurements using electron-impact excitation

Jan 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993jqsrt..49...53y&link_type=abstract

Journal of Quantitative Spectroscopy and Radiative Transfer (ISSN 0022-4073), vol. 49, no. 1, p. 53-64.

Physics

Plasma Physics

2

Branching (Mathematics), Electron Impact, Extreme Ultraviolet Radiation, Oxygen Ions, Astrophysics, Plasma Physics, Transition Probabilities

Scientific paper

The branching-ratio technique is employed to determine ratios of transition probabilities of EUV transitions of O II, N II, S II, S III, Ne III, and Cl II. The transitions were excited under optically thin conditions using electron-impact excitation of low-pressure gases and vapors. Significant improvements in operation resolution (to 0.04 A) and S/N recovery capabilities of the data-acquisition system over previous studies made it possible to resolve blended branching emissions and monitor weak components. A total of 22 ratios, including seven first-time determinations, are reported.

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