Ion-induced secondary electron emission from K-Cs-Sb, Na-K-Sb and Cs-Sb photocathodes and its relevance to the operation of gaseous avalanche photomultipliers

Details Ion-induced secondary electron emission from K-Cs-Sb, Na-K-Sb and Cs-Sb photocathodes and its relevance to the operation of gaseous avalanche photomultipliers Ion-induced secondary electron emission from K-Cs-Sb, Na-K-Sb and Cs-Sb photocathodes and its relevance to the operation of gaseous avalanche photomultipliers

2009-04-30

arxiv.org/abs/0904.4881v1

A.Lyashenko et. al., J. Appl. Phys. 106 (2009) 044902

Physics

Instrumentation and Detectors

10 pages, 10 figures, for submission to J. Appl. Phys; (2009) accepted

Scientific paper

10.1063/1.3197063

The operation of visible-sensitive gaseous- and, to some extent, vacuum-photomultipliers is critically affected by secondary electrons originating from ion impact on the photocathode. A simple method for indirect measurement of the effective ion-induced secondary-electron emission (IISEE) coefficient from the photocathode into a gas medium, $\gamma_+^{eff}$ was developed. The experimental results with visible-sensitive K-Cs-Sb, Na-K-Sb and Cs-Sb photocathodes, yielded $\gamma_+^{eff}$ - values between 0.02 and 0.03 in Ar/CH$_{4}$ (95/5) at 700 mbar; these are in good agreement with theoretical calculations. The corresponding vacuum IISEE coefficients, $\gamma_+$, were estimated, based on a theoretical model, to be 0.47, 0.49 and 0.47 for K-Cs-Sb, Na-K-Sb and Cs-Sb photocathodes, respectively. The ratio of gas $\gamma_+^{eff}$ and vacuum $\gamma_+$ IISEE coefficients, calculated to be $\sim$0.06, is the fraction of secondary electrons surmounted the backscattering in the gas media.

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